ASTM E1523-97
Historical Standard: ASTM E1523-97 Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
SUPERSEDED (see Active link, below)
ASTM E1523
1. Scope
1.1 This guide covers the acquainting of the XPS user with the various charge control and charge shift referencing techniques that are and have been used in the acquisition and interpretation of X-ray photoelectron spectroscopy (XPS) data from surfaces of insulating specimens.
1.2 This guide is intended to apply to charge control and charge referencing techniques in XPS and is not necessarily applicable to electron-excited systems.
1.3 SI units are standard unless otherwise noted.
1.4 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
2. Referenced Documents (purchase separately) The documents listed below are referenced within the subject standard but are not provided as part of the standard.
ASTM Standards
E673 Terminology Relating to Surface Analysis
E902 Practice for Checking the Operating Characteristics of X-Ray Photoelectron Spectrometers
E1078 Guide for Specimen Preparation and Mounting in Surface Analysis
E1829 Guide for Handling Specimens Prior to Surface Analysis
Keywords
charge control; charge referencing; charging; X-ray photoelectron spectroscopy; Surface analysis--spectrochemical analysis; Auger electron spectroscopy (AES); Bias referencing; Charge control/referencing; Gold decoration; Gold metals/alloys; Inert gases; Internal referencing; Key referencing; Surface charging; X-ray photoelectron spectroscopy (XPS);
ICS Code
ICS Number Code 71.040.50 (Physicochemical methods of analysis)
DOI: 10.1520/E1523-97
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