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  • BSI
    BS ISO 13095:2014 Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
    Edition: 2014
    $442.60
    / user per year

Description of BS ISO 13095:2014 2014

This International Standard specifies two methods for characterizing the shape of an AFM probe tip, specifically the shank and approximate tip profiles. These methods project the profile of an AFM probe tip onto a given plane, and the characteristics of the probe shank are also projected onto that plane under defined operating conditions. The latter indicates the usefulness of a given probe for depth measurements in narrow trenches and similar profiles. This International Standard is applicable to the probes with radii greater than 5u0, where u0 is the uncertainty of the width of the ridge structure in the reference sample used to characterize the probe.



Standard NumberBS ISO 13095:2014
TitleSurface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
StatusConfirmed
Publication Date2014-08-31
Identical National Standard OfISO 13095:2014
DescriptorsSurfaces, Chemical analysis and testing, Spectroscopy, Surface properties, Vocabulary, Definitions
ICS71.040.40 Chemical analysis
CommitteeCII/60
ISBN978 0 580 67752 6
PublisherBSI
Pages36

About BSI

BSI Group, also known as the British Standards Institution is the national standards body of the United Kingdom. BSI produces technical standards on a wide range of products and services and also supplies certification and standards-related services to businesses.
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