ASTM F1263-99(2005)
Historical Standard: ASTM F1263-99(2005) Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
SUPERSEDED (see Active link, below)
ASTM F1263
1. Scope
1.1 This guide covers the use of overtesting in order to reduce the required number of parts that must be tested to meet a given quality acceptance standard. Overtesting is testing a sample number of parts at a stress higher than their specification stress in order to reduce the amount of necessary data taking. This guide discusses when and how overtesting may be applied to forming probabilistic estimates for the survival of electronic piece parts subjected to radiation stress. Some knowledge of the probability distribution governing the stress-to-failure of the parts is necessary though exact knowledge may be replaced by over-conservative estimates of this distribution.
2. Referenced Documents (purchase separately) The documents listed below are referenced within the subject standard but are not provided as part of the standard.
Military Standards
MIL-PRF38535 Integrated Circuits (Microcircuit Manufacturing)Keywords
confidence; rejection; overtest data; statistical analysis; Acceptance criteria/testing; Data analysis; Electrical conductors (semiconductors); Estimated survival probability; Failure end point--electronic components/devices; Microelectronic devices; Overtest data; Probability of survival; Quality assurance (QA); Stress--electronic components/device;
ICS Code
ICS Number Code 31.020 (Electronic components in general)
DOI: 10.1520/F1263-99R05
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