Cart (0)
  • No items in cart.
Total
$0
There is a technical issue about last added item. You can click "Report to us" button to let us know and we resolve the issue and return back to you or you can continue without last item via click to continue button.
Filters:
FORMAT
EDITION
to
PUBLISHER
(1)
(337)
(589)
(55)
(234)
(996)
(690)
(2161)
(117)
(94624)
(54)
(575)
(124)
(33)
(21)
(20)
(94991)
(3)
(17)
(1)
(374)
(315)
(6731)
(241)
(16)
(6)
(1646)
(17)
(19)
(28)
(4)
 
(6)
(7)
(115)
(3)
(57)
(5)
(5)
(1)
(1)
(2)
(25)
(27)
(27)
(13)
(61)
(24)
(22)
(7)
(8)
(20)
(1)
(3)
(50)
(6)
(33)
CONTENT TYPE
 Act
 Admin Code
 Announcements
 Bill
 Book
 CADD File
 CAN
 CEU
 Charter
 Checklist
 City Code
 Code
 Commentary
 Comprehensive Plan
 Conference Paper
 County Code
 Course
 DHS Documents
 Document
 Errata
 Executive Regulation
 Federal Guideline
 Firm Content
 Guideline
 Handbook
 Interpretation
 Journal
 Land Use and Development
 Law
 Legislative Rule
 Local Amendment
 Local Code
 Local Document
 Local Regulation
 Local Standards
 Manual
 Model Code
 Model Standard
 Notice
 Ordinance
 Other
 Paperback
 PASS
 Periodicals
 PIN
 Plan
 Policy
 Product
 Product - Data Sheet
 Program
 Provisions
 Requirements
 Revisions
 Rules & Regulations
 Standards
 State Amendment
 State Code
 State Manual
 State Plan
 State Standards
 Statute
 Study Guide
 Supplement
 Sustainability
 Technical Bulletin
 All
  • ASTM
    F1192-00(2006) Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
    Edition: 2006
    $113.57
    Unlimited Users per year

Description of ASTM-F1192 2006

ASTM F1192-00(2006)

Historical Standard: ASTM F1192-00(2006) Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices

SUPERSEDED (see Active link, below)




ASTM F1192

1. Scope

1.1 This guide defines the requirements and procedures for testing integrated circuits and other devices for the effects of single event phenomena (SEP) induced by irradiation with heavy ions having an atomic number Z 2. This description specifically excludes the effects of neutrons, protons, and other lighter particles that may induce SEP via another mechanism. SEP includes any manifestation of upset induced by a single ion strike, including soft errors (one or more simultaneous reversible bit flips), hard errors (irreversible bit flips), latchup (permanent high conducting state), transients induced in combinatorial devices which may introduce a soft error in nearby circuits, power field effect transistor (FET) burn-out and gate rupture. This test may be considered to be destructive because it often involves the removal of device lids prior to irradiation. Bit flips are usually associated with digital devices and latchup is usually confined to bulk complementary metal oxide semiconductor, (CMOS) devices, but heavy ion induced SEP is also observed in combinatorial logic programmable read only memory, (PROMs), and certain linear devices that may respond to a heavy ion induced charge transient. Power transitors may be tested by the procedure called out in Method 1080 of MIL STD 750.

1.2 The procedures described here can be used to simulate and predict SEP arising from the natural space environment, including galactic cosmic rays, planetary trapped ions and solar flares. The techniques do not, however, simulate heavy ion beam effects proposed for military programs. The end product of the test is a plot of the SEP cross section (the number of upsets per unit fluence) as a function of ion LET (linear energy transfer, or ionization deposited along the ion's path through the semiconductor). This data can be combined with the system's heavy ion environment to estimate a system upset rate.

1.3 Although protons can cause SEP, they are not included in this guide. A separate guide addressing proton induced SEP is being considered.

1.4 The values stated in International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this guide.

This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.


2. Referenced Documents (purchase separately) The documents listed below are referenced within the subject standard but are not provided as part of the standard.

Military Standard

750Method1080

Keywords

SEB; SEE; SEFI; SEGR; SEL; SEP; SEP cross section; SEU; single event; single event effect; single event phenomena; single event upset; space environment: Destructive testing--semiconductors; Dosimetry; Electrical conductors (semiconductors); Electron radiation; Failure end point--electronic components/devices; Fluence; Galactic cosmic rays; Germanium--semiconductor applications; Integrated circuits; Ionizing radiation; Irradiance/irradiation--semiconductors; Linear energy transfer (LET); Radiation exposure--electronic components/devices; Silicon semiconductors; Single crystal silicon semiconductors; Single-event phenomenon (SEP); Solar flares; Upset threshold;


ICS Code

ICS Number Code 31.080.01 (Semi-conductor devices in general)


DOI: 10.1520/F1192-00R06

ASTM International is a member of CrossRef.


This book also exists in the following packages...

Year Publisher Title Annual Price
VAR
ASTM
[+] $1,164.67 Buy
VAR
ASTM
[+] $1,737.94 Buy
VAR
ASTM
[+] $971.23 Buy
VAR
ASTM
[+] $2,452.26 Buy

Subscription Information

MADCAD.com ASTM Standards subscriptions are annual and access is unlimited concurrency based (number of people that can access the subscription at any given time) from single office location. For pricing on multiple office location ASTM Standards Subscriptions, please contact us at info@madcad.com or +1 800.798.9296.

 

Some features of MADCAD.com ASTM Standards Subscriptions are:

- Online access: With MADCAD.com’ s web based subscription service no downloads or installations are required. Access ASTM Standards from any browser on your computer, tablet or smart phone.

- Immediate Access: As soon as the transaction is completed, your ASTM Standards Subscription will be ready for access.

 

For any further information on MADCAD.com ASTM Standards Subscriptions, please contact us at info@madcad.com or +1 800.798.9296.

 

About ASTM

ASTM International, formerly known as the American Society for Testing and Materials (ASTM), is a globally recognized leader in the development and delivery of international voluntary consensus standards. Today, some 12,000 ASTM standards are used around the world to improve product quality, enhance safety, facilitate market access and trade, and build consumer confidence. ASTM’s leadership in international standards development is driven by the contributions of its members: more than 30,000 of the world’s top technical experts and business professionals representing 150 countries. Working in an open and transparent process and using ASTM’s advanced electronic infrastructure, ASTM members deliver the test methods, specifications, guides, and practices that support industries and governments worldwide.

GROUPS