1. Scope

1.1 This guide covers procedures for determining the energy-differential fluence spectra of neutrons used in radiation-hardness testing of electronic semiconductor devices. The types of neutron sources specifically covered by this guide are fission or degraded energy fission sources used in either a steady-state or pulse mode.

1.2 This guide provides guidance and criteria that can be applied during the process of choosing the spectrum adjustment methodology that is best suited to the available data and relevant for the environment being investigated.

1.3 This guide is to be used in conjunction with Guide E 720 to characterize neutron spectra and is used in conjunction with Practice E 722 to characterize damage-related parameters normally associated with radiation-hardness testing of electronic-semiconductor devices. Note 1Although Guide E 720 only discusses activation foil sensors, any energy-dependent neutron-responding sensor for which a response function is known may be used () .

For terminology used in this guide, see Terminology E 170.

1.4 The values stated in SI units are to be regarded as the standard.

This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

2. Referenced Documents (purchase separately) The documents listed below are referenced within the subject standard but are not provided as part of the standard.

ASTM Standards

E170 Terminology Relating to Radiation Measurements and Dosimetry

E261 Practice for Determining Neutron Fluence, Fluence Rate, and Spectra by Radioactivation Techniques

E262 Test Method for Determining Thermal Neutron Reaction Rates and Thermal Neutron Fluence Rates by Radioactivation Techniques

E263 Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Iron

E264 Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Nickel

E265 Test Method for Measuring Reaction Rates and Fast-Neutron Fluences by Radioactivation of Sulfur-32

E266 Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Aluminum

E393 Test Method for Measuring Reaction Rates by Analysis of Barium-140 From Fission Dosimeters

E523 Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Copper

E526 Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Titanium

E704 Test Method for Measuring Reaction Rates by Radioactivation of Uranium-238

E705 Test Method for Measuring Reaction Rates by Radioactivation of Neptunium-237

E720 Guide for Selection and Use of Neutron Sensors for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics

E722 Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics

E844 Guide for Sensor Set Design and Irradiation for Reactor Surveillance, E 706 (IIC)

E944 Guide for Application of Neutron Spectrum Adjustment Methods in Reactor Surveillance, E 706 (IIA)

E1018 Guide for Application of ASTM Evaluated Cross Section Data File, Matrix E706 (IIB)

E1297 Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Niobium

E1855 Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

Keywords

neutron sensors; neutron spectra; radiation-hardness testing; spectrum adjustment;

ICS Code

ICS Number Code 83.140.10 (Films and sheets)

DOI: 10.1520/E0721-07

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