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  • ASTM
    E673-98E1 Standard Terminology Relating to Surface Analysis
    Edition: 0
    $144.00
    Unlimited Users per year

Description of ASTM-E673-98E1 0

ASTM E673-98E1

Historical Standard: Standard Terminology Relating to Surface Analysis




ASTM E673

Scope

1.1 This terminology is related to the various disciplines involved in surface analysis.

1.2 The definitions listed apply to (a) Auger electron spectroscopy (AES), (b) X-ray photoelectron spectroscopy (XPS), (c) ion-scattering spectroscopy (ISS), (d) secondary ion mass spectrometry (SIMS), and (e) energetic ion analysis (EIA).


Keywords

terminology


ICS Code

ICS Number Code 01.040.17 (Metrology and measurement. Physical phenomena (Vocabularies))


DOI: 10.1520/E0673-98E01



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