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eLibrary > BS ISO 20263:2024 - TC Tracked Changes. Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials >

BS ISO 20263:2024 - TC Tracked Changes. Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials, 2024

BS ISO 20263:2024 - TC Tracked Changes. Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials, 2024

A-30479445.pdf [Go to Page]
undefined
Foreword
Introduction
1 Scope
2 Normative references
3 Terms, definitions and abbreviated terms [Go to Page]
3.1 Terms and definitions
3.2 Abbreviated terms
4 Specimen preparation for cross-sectional imaging [Go to Page]
4.1 General
4.2 Requirements for the cross-sectional specimen
5 Determination of an interface position [Go to Page]
5.1 General
5.2 Preliminary considerations [Go to Page]
5.2.1 Ideal model of an interface
5.2.2 More realistic model of an interface
5.2.3 Dealing with intensity fluctuations in the image
6 Detailed procedure for determining the position of the interface [Go to Page]
6.1 General
6.2 Preparing cross-sectional TEM/STEM image [Go to Page]
6.2.1 Preparing digitized Image
6.2.2 Displaying the digitized image
6.3 Setting the ROI [Go to Page]
6.3.1 General
6.3.2 Classification of image
6.3.3 Procedure of setting the ROI
6.4 Acquisition of the averaged intensity profile
6.5 Moving-averaged processing
6.6 Differential processing
6.7 Determination of interface position
7 Uncertainty [Go to Page]
7.1 Uncertainty accumulating from each step of the procedure
7.2 Uncertainty of measurement result on image analysis
Annex A (informative) Examples of processing the real TEM/STEM images for three image types
Annex B (informative) Two main applications of the method
Annex C (informative) Calibration of scale unit: Pixel size calibration
Bibliography [Go to Page]

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BS ISO 20263:2024 - TC Tracked Changes. Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials, 2024

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