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eLibrary > BS EN IEC 60384-21:2024 Fixed capacitors for use in electronic equipment - Sectional specification. Fixed surface mount multilayer capacitors of ceramic dielectric, Class 1 >

BS EN IEC 60384-21:2024 Fixed capacitors for use in electronic equipment - Sectional specification. Fixed surface mount multilayer capacitors of ceramic dielectric, Class 1, 2024

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Annex ZA (normative)Normative references to international publicationswith their corresponding European publications [Go to Page]
English [Go to Page]
CONTENTS
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Preferred ratings and characteristics [Go to Page]
4.1 Preferred characteristics
4.2 Preferred values of ratings [Go to Page]
4.2.1 Rated temperature (TR)
4.2.2 Rated voltage (UR)
4.2.3 Category voltage (UC)
4.2.4 Preferred values of nominal capacitance and associated tolerance values
Tables [Go to Page]
Table 1 – Preferred tolerances on nominal capacitance [Go to Page]
4.2.5 Temperature coefficient (α)
Table 2 – Nominal temperature coefficient and tolerance (for reference temperature 20 °C)
Table 3 – Combination of temperature coefficient and tolerance [Go to Page]
4.2.6 Dimensions
5 Test and measurement procedures [Go to Page]
5.1 General
5.2 Preliminary drying
5.3 Measuring conditions
5.4 Mounting
5.5 Visual examination and check of dimensions [Go to Page]
5.5.1 General
5.5.2 Visual examination
5.5.3 Requirements
Figures [Go to Page]
Figure 1 – Fault: crack or fissure
Figure 2 – Fault: crack or fissure
Figure 3 – Separation or delamination
Figure 4 – Exposed electrodes
5.6 Electrical tests [Go to Page]
5.6.1 Capacitance
5.6.2 Tangent of loss angle (tan δ)
Figure 5 – Principal faces [Go to Page]
5.6.3 Insulation resistance
Table 4 – Tangent of loss angle limits [Go to Page]
5.6.4 Voltage proof
5.7 Temperature coefficient (α) and temperature cyclic drift [Go to Page]
5.7.1 General
Table 5 – Test voltages [Go to Page]
5.7.2 Preliminary drying
5.7.3 Measuring conditions
5.7.4 Requirements
5.8 Shear test
5.9 Substrate bending test [Go to Page]
5.9.1 General
5.9.2 Initial measurement
Table 6 – Temperature cyclic drift limits [Go to Page]
5.9.3 Final inspection
5.10 Resistance to soldering heat [Go to Page]
5.10.1 General
5.10.2 Initial measurement
5.10.3 Test conditions
5.10.4 Recovery
5.10.5 Final inspection, measurements and requirements
Figure 6 – Reflow temperature profile
Table 7 – Reflow temperature profiles for Sn-Ag-Cu alloy
Table 8 – Maximum capacitance change
5.11 Solderability [Go to Page]
5.11.1 General
5.11.2 Test conditions
5.11.3 Recovery
5.11.4 Final inspection, measurements and requirements
5.12 Rapid change of temperature [Go to Page]
5.12.1 General
5.12.2 Initial measurement
5.12.3 Number of cycles
5.12.4 Recovery
5.12.5 Final inspection, measurements and requirements
5.13 Climatic sequence [Go to Page]
5.13.1 General
5.13.2 Initial measurement
Table 9 – Maximum capacitance change [Go to Page]
5.13.3 Dry heat
5.13.4 Damp heat, cyclic, Test Db, first cycle
5.13.5 Cold
5.13.6 Damp heat, cyclic, Test Db, remaining cycles
5.13.7 Final inspection, measurements and requirements
Table 10 – Number of damp heat cycles
Table 11 – Final inspection, measurements and requirements
5.14 Damp heat, steady state [Go to Page]
5.14.1 General
5.14.2 Initial measurement
5.14.3 Test conditions
5.14.4 Recovery
5.14.5 Final inspection, measurements and requirements
Table 12 – Test conditions for damp heat, steady state
5.15 Endurance [Go to Page]
5.15.1 General
5.15.2 Initial measurement
5.15.3 Test conditions
Table 13 – Final inspection, measurements and requirements
Table 14 – Endurance test conditions (UC = UR) [Go to Page]
5.15.4 Recovery
5.15.5 Final inspection, measurements and requirements
5.16 Robustness of terminations (only for capacitors with strip termination) [Go to Page]
5.16.1 General
5.16.2 Test conditions
Table 15 – Endurance test conditions (UC ≠ UR)
Table 16 – Final inspection, measurements and requirements [Go to Page]
5.16.3 Final inspection and requirements
5.17 Component solvent resistance (if required)
5.18 Solvent resistance of the marking (if required)
5.19 Accelerated damp heat, steady state (if required) [Go to Page]
5.19.1 General
5.19.2 Initial measurement
5.19.3 Conditioning
Table 17 – Initial requirements [Go to Page]
5.19.4 Recovery
5.19.5 Final measurements
6 Marking [Go to Page]
6.1 General
6.2 Information for marking
6.3 Marking on the body
6.4 Requirements for marking
Table 18 – Conditioning
6.5 Marking of the packaging
6.6 Additional marking
7 Information to be given in a detail specification [Go to Page]
7.1 General
7.2 Outline drawing and dimensions
7.3 Mounting
7.4 Rating and characteristics [Go to Page]
7.4.1 General
7.4.2 Nominal capacitance range
7.4.3 Particular characteristics
7.4.4 Soldering
7.5 Marking
8 Quality assessment procedures [Go to Page]
8.1 Primary stage of manufacture
8.2 Structurally similar components
8.3 Certified records of released lots
8.4 Qualification approval [Go to Page]
8.4.1 General
8.4.2 Qualification approval on the basis of the fixed sample size procedures
8.4.3 Tests
Table 19 – Fixed sample size test plan for qualification approval Assessment level EZ
Table 20 – Tests schedule for qualification approval
Annexes [Go to Page]
Annex A (normative) Guidance for the specification and coding of dimensions of fixed surface mount multilayer capacitors of ceramic dielectric, Class 1
Figure A.1 – Dimensions
Table A.1 – Dimensions
Annex B (normative) Combination of temperature coefficients and tolerances for the reference temperature of 25 °C
Table B.1 – Combination of temperature coefficients and tolerances for the reference temperature of 25 °C
Annex C (normative) Quality conformance inspection [Go to Page]
C.1 Formation of inspection lots [Go to Page]
C.1.1 Groups A and B inspection
C.1.2 Group C inspection
C.2 Test schedule
C.3 Delayed delivery
C.4 Assessment levels
C.5 Test schedule for quality conformance inspection
Table C.1 – Lot by lot inspection
Table C.2 – Periodic inspection
Table C.3 – Test schedule for quality conformance inspection (lot by lot)
Table C.4 – Test schedule for quality conformance inspection (Periodic test)
Annex X (informative) Cross-reference for reference to IEC 60384-21:2019
Table X.1 – Reference to IEC 60384-21 for clause/annex
Table X.2 – Reference to IEC 60384-21 for figure/table
Bibliography [Go to Page]

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