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PD IEC TS 63144-1:2020 Industrial process control devices. Thermographic cameras - Metrological characterization, 2020
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- CONTENTS
- FOREWORD
- INTRODUCTION
- 1 Scope
- 2 Normative references
- 3 Terms and definitions
- 4 Symbols
- 5 Abbreviated terms
- Table 1 – Symbols
- 6 Determination of technical data [Go to Page]
- 6.1 General
- 6.2 Measuring temperature range [Go to Page]
- 6.2.1 General
- Figures [Go to Page]
- Figure 1 – Schematic measuring setup [Go to Page]
- 6.2.2 Required parameters
- 6.2.3 Examples of indications
- 6.2.4 Test condition, method and procedure for measuring temperature range
- 6.3 Noise equivalent temperature difference (NETD) [Go to Page]
- 6.3.1 General
- 6.3.2 Required parameters
- 6.3.3 Examples of indications
- 6.3.4 Test condition, method and procedure for noise equivalent temperature difference
- 6.4 Measuring distance (d) [Go to Page]
- 6.4.1 General
- 6.4.2 Required parameters
- 6.4.3 Examples of indications
- 6.4.4 Test condition, method and procedure for measuring distance
- 6.5 Field of view (FOV) [Go to Page]
- 6.5.1 General
- 6.5.2 Required parameters
- 6.5.3 Examples of indications
- 6.5.4 Test condition, method and procedure for field of view
- 6.6 Number of image elements
- 6.7 Detector format used (number of detector elements used)
- 6.8 Instantaneous field of view (IFOV) [Go to Page]
- 6.8.1 General
- 6.8.2 Required parameters
- 6.8.3 Example of indications
- 6.8.4 Test condition, method and procedure for instantaneous field of view
- 6.9 Slit response function (SRF) [Go to Page]
- 6.9.1 General
- 6.9.2 Required parameters
- 6.9.3 Examples of indications
- 6.9.4 Test condition, method and procedure for slit response function
- Figure 2 – Slit response function
- 6.10 Minimum field of view for temperature measurement (MFOVT) [Go to Page]
- 6.10.1 General
- Figure 3 – Minimum size of a measuring spot for temperature measurement [Go to Page]
- 6.10.2 Required parameters
- 6.10.3 Example of indications
- 6.10.4 Test condition, method and procedure for minimum field of view for temperature measurement
- 6.11 Spectral range [Go to Page]
- 6.11.1 General
- 6.11.2 Examples of indications
- 6.11.3 Test condition, method and procedure for spectral range
- 6.12 Emissivity setting [Go to Page]
- 6.12.1 General
- 6.12.2 Examples of indications
- 6.12.3 Test condition, method and procedure for emissivity setting
- 6.13 Influence of the internal instrument temperature [Go to Page]
- 6.13.1 General
- 6.13.2 Required parameters
- 6.13.3 Examples of indications
- 6.13.4 Test condition, method and procedure for influence of the internal instrument temperature
- 6.14 Influence of the humidity [Go to Page]
- 6.14.1 General
- 6.14.2 Required parameters
- 6.14.3 Example of indications
- 6.14.4 Test condition, method and procedure for influence of the humidity
- 6.15 Long-term stability [Go to Page]
- 6.15.1 General
- 6.15.2 Required parameters
- 6.15.3 Example of indication
- 6.15.4 Test condition, method and procedure for long-term stability
- 6.16 Short-term stability [Go to Page]
- 6.16.1 General
- 6.16.2 Required parameters
- 6.16.3 Example of indication
- 6.16.4 Test condition, method and procedure for short-term stability
- 6.17 Repeatability [Go to Page]
- 6.17.1 General
- 6.17.2 Required parameters
- 6.17.3 Example of indication
- 6.17.4 Test condition, method and procedure for repeatability
- 6.18 Interchangeability (spread of production) [Go to Page]
- 6.18.1 General
- 6.18.2 Required parameters
- 6.18.3 Example of indication
- 6.18.4 Test condition, method and procedure for interchangeability (spread of production)
- 6.19 Response time [Go to Page]
- 6.19.1 General
- Figure 4 – Synchronous signal acquisition for a quantum detector
- Figure 5 – Asynchronous signal acquisition for a quantum detector
- Figure 6 – Asynchronous signal acquisition for a thermal detector (best case) [Go to Page]
- 6.19.2 Required parameters
- 6.19.3 Example of indication
- 6.19.4 Test condition, method and procedure for response time
- Figure 7 – Asynchronous signal acquisition for a thermal detector (worst case)
- 6.20 Exposure time [Go to Page]
- 6.20.1 General
- 6.20.2 Required parameters
- 6.20.3 Example of indication
- 6.20.4 Test condition, method and procedure for exposure time
- 6.21 Warm-up time [Go to Page]
- 6.21.1 General
- 6.21.2 Required parameters
- 6.21.3 Examples of indication
- 6.21.4 Test condition, method and procedure for warm-up time
- 6.22 Integration time setting range [Go to Page]
- 6.22.1 General
- 6.22.2 Required parameters
- 6.22.3 Example of indication
- 6.23 Refresh rate [Go to Page]
- 6.23.1 General
- Figure 8 – Example of the measurement of the warm-up time [Go to Page]
- 6.23.2 Example of indication
- 6.23.3 Test condition, method and procedure for refresh rate
- 6.24 Non-uniformity (inhomogeneity of detector responsivity) [Go to Page]
- 6.24.1 General
- 6.24.2 Required parameters
- 6.24.3 Example of indication
- 6.24.4 Test condition, method and procedure for non-uniformity
- 6.25 Inhomogeneity equivalent temperature difference (IETD) [Go to Page]
- 6.25.1 General
- 6.25.2 Required parameters
- 6.25.3 Examples of indications
- 6.25.4 Test condition, method and procedure for inhomogeneity equivalent temperature difference
- 6.26 Operating temperature range and air humidity range [Go to Page]
- 6.26.1 General
- 6.26.2 Example of indication
- 6.26.3 Test condition, method and procedure for operating temperature range and air humidity range
- 6.27 Size-of-source effect (SSE) [Go to Page]
- 6.27.1 General
- 6.27.2 Required parameters
- 6.27.3 Examples of indications
- 6.27.4 Test condition, method and procedure for size-of-source effect
- Annex A (informative)Change in the indicated temperature caused by a 1 % change in the radiative interchange
- Table A.1 – Change in the indicated temperature
- Bibliography [Go to Page]