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BS EN 60384-8:2015 Fixed capacitors for use in electronic equipment - Sectional specification: Fixed capacitors of ceramic dielectric, Class 1, 2018
- undefined
- English [Go to Page]
- CONTENTS
- FOREWORD
- 1 General [Go to Page]
- 1.1 Scope
- 1.2 Object
- 1.3 Normative references
- 1.4 Information to be given in a detail specification [Go to Page]
- 1.4.1 General
- 1.4.2 Outline drawing and dimensions
- 1.4.3 Mounting
- 1.4.4 Ratings and characteristics
- 1.4.5 Marking
- 1.5 Terms and definitions
- 1.6 Marking [Go to Page]
- 1.6.1 General
- 1.6.2 Marking for code of temperature coefficient
- 1.6.3 Marking on the body
- 1.6.4 Marking of the packaging
- 1.6.5 Additional marking
- 2 Preferred ratings and characteristics [Go to Page]
- 2.1 Preferred characteristics
- 2.2 Preferred values of ratings [Go to Page]
- 2.2.1 Rated temperature
- 2.2.2 Rated voltage (UR)
- 2.2.3 Category voltage (UC)
- 2.2.4 Preferred values of nominal capacitance and associated tolerance values
- 2.2.5 Temperature coefficient (α)
- Tables [Go to Page]
- Table 1 – Preferred tolerances on nominal capacitance
- Table 2 – Nominal temperature coefficient and tolerances
- Table 3 – Combination of temperature coefficient and tolerance
- 3 Quality assessment procedures [Go to Page]
- 3.1 Primary stage of manufacture
- 3.2 Structurally similar components
- 3.3 Certified test records of released lots
- 3.4 Qualification approval [Go to Page]
- 3.4.1 General
- 3.4.2 Qualification approval on the basis of the fixed sample size procedure
- 3.4.3 Tests
- Table 4 – Sampling plan together with numbers of permissible non-conforming items for qualification approval tests, assessment level EZ
- Table 5 – Test schedule for qualification approval (1 of 4)
- 3.5 Quality conformance inspection [Go to Page]
- 3.5.1 Formation of inspection lots
- 3.5.2 Test schedule
- 3.5.3 Delayed delivery
- 3.5.4 Assessment levels
- Table 6 – Lot-by-lot inspection
- 4 Test and measurement procedures [Go to Page]
- 4.1 General
- 4.2 Visual examination and check of dimensions
- 4.3 Electrical tests [Go to Page]
- 4.3.1 Capacitance
- Table 7 – Periodic tests [Go to Page]
- 4.3.2 Tangent of loss angle (tan δ)
- 4.3.3 Insulation resistance (Ri)
- Table 8 – Tangent of loss angle [Go to Page]
- 4.3.4 Voltage proof
- Table 9 – Insulation resistance requirements
- Table 10 – Test voltages for single layer ceramic capacitors
- Table 11 – Test voltages for leaded multilayer ceramic capacitors
- 4.4 Temperature coefficient (α) and temperature cyclic drift of capacitance [Go to Page]
- 4.4.1 General
- 4.4.2 Preliminary drying
- 4.4.3 Measuring conditions
- 4.4.4 Requirements
- 4.5 Robustness of terminations
- 4.6 Resistance to soldering heat [Go to Page]
- 4.6.1 General
- 4.6.2 Initial measurement
- 4.6.3 Test conditions
- 4.6.4 Final inspection, measurements and requirements
- Table 12 – Temperature cyclic drift limits
- 4.7 Solderability [Go to Page]
- 4.7.1 General
- 4.7.2 Test conditions
- 4.7.3 Final inspection, measurements and requirements
- 4.8 Rapid change of temperature (if required) [Go to Page]
- 4.8.1 General
- 4.8.2 Initial measurement
- 4.8.3 Test conditions
- 4.8.4 Recovery
- 4.9 Vibration [Go to Page]
- 4.9.1 General
- Table 13 – Requirements [Go to Page]
- 4.9.2 Test conditions
- 4.9.3 Final inspection, measurements and requirements
- 4.10 Bump (repetitive shock) [Go to Page]
- 4.10.1 General
- 4.10.2 Initial measurements
- 4.10.3 Test conditions
- 4.10.4 Final inspection, measurements and requirements
- 4.11 Shock (non-repetitive shock) [Go to Page]
- 4.11.1 General
- 4.11.2 Initial measurements
- 4.11.3 Test conditions
- 4.11.4 Final inspection, measurements and requirements
- 4.12 Climatic sequence [Go to Page]
- 4.12.1 General
- 4.12.2 Initial measurements
- 4.12.3 Dry heat
- Table 14 – Preferred severities (of non-repetitive shock)
- Table 15 – Maximum capacitance change [Go to Page]
- 4.12.4 Damp heat, cyclic, Test Db, first cycle
- 4.12.5 Cold
- 4.12.6 Low air pressure
- 4.12.7 Damp heat, cyclic, Test Db, remaining cycles
- Table 16 – Number of damp heat cycles
- 4.13 Damp heat, steady state [Go to Page]
- 4.13.1 General
- 4.13.2 Initial measurement
- 4.13.3 Test conditions
- Table 17 – Final inspection, measurements and requirements
- Table 18 – Test conditions for damp heat, steady state [Go to Page]
- 4.13.4 Recovery
- 4.13.5 Final inspection, measurements and requirements
- 4.14 Endurance [Go to Page]
- 4.14.1 General
- 4.14.2 Initial measurement
- 4.14.3 Test conditions
- Table 19 – Final inspection, measurements and requirements [Go to Page]
- 4.14.4 Recovery
- 4.14.5 Final inspection, measurements and requirements
- 4.15 Component solvent resistance (if required)
- 4.16 Solvent resistance of the marking (if required)
- Table 20 – Endurance test conditions
- Table 21 – Final inspection, measurements and requirements
- Annex A (normative) Figures with limits of variation of capacitance with temperature for certain temperature coefficients and classes
- Figures [Go to Page]
- Figure A.1 – α: +100 (10–6/K)
- Figure A.2 – α: 0 –10–6/K)
- Figure A.3 – α: –33 (10–6/K)
- Figure A.4 – α: –75 (10–6/K)
- Figure A.5 – α: –150 (10–6/K)
- Figure A.6 – α: –220 (10–6/K)
- Figure A.7 – α: –330 (10–6/K)
- Figure A.8 – α: –470 (10–6/K)
- Figure A.9 – α: –750 (10–6/K)
- Figure A.10 – α: –1 000 (10–6/K)
- Figure A.11 – α: –1 500 (10–6/K)
- Figure A.12 – α: –2 200 (10–6/K)
- Figure A.13 – α: –3 300 (10–6/K)
- Figure A.14 – α: –4 700 (10–6/K)
- Figure A.15 – α: –5 600 (10–6/K)
- Bibliography [Go to Page]